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光伏電池膜厚測量儀

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公司名稱上海益朗儀器有限公司
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型號SMX-BEN
所在地上海市
廠商性質(zhì)經(jīng)銷商
更新時間2018/5/14 9:00:00
訪問次數(shù)650

產(chǎn)品標(biāo)簽:

光伏電池薄膜厚度測量儀太陽能電池薄膜測厚儀

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哈氏槽,離心機,庫侖測厚儀，孔銅測厚儀，X射線測厚儀，可焊性測試儀，離子污染測試儀，電鍍添加劑分析儀，CVS，輻射測量表，金相切割機，金相磨拋機，鑲嵌機，砂紙，絨布，拋光粉，液，膏，水質(zhì)測試包，水質(zhì)分析儀,EXTECH,銅箔測厚儀,孔規(guī)

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美國Solar Metrology 太陽能發(fā)電和太陽能再生能源產(chǎn)業(yè)用的X-熒光分析儀
可鍍層測厚儀和元素分析

：丁成峰

光伏電池膜厚測量儀產(chǎn)品信息

SMX-BEN Benchtop XRF Metrology Tool（：丁成峰）

Solar Metrology System SMX tools excel at process development and failure analysis, as well as intricate analysis of full-panel deposition gradients.
The SMX-BEN benchtop platform is an excellent choice for R&D, process development and failure analysis. SMX-BEN delivers applications versatility and unsurpassed measurement performance in a compact form factor.
SMX-BEN facilitates material selection and recipe formulation in a pre- or early production ramp phase, and will continue to support your SMX production tool platforms well into capacity production.

MIRA AnalysisTM is an integrated XRF analysis and process control suite. MIRA combines powerful analysis tools with an intuitive, easy to use operator interface that is consistent across all SMX tool platforms.