簡要描述:晶體尺寸:~6毫米電學(xué)性能:半導(dǎo)體晶體結(jié)構(gòu):六邊形晶胞參數(shù):取決于合金成分:a = b = 0.31 -0.33 nm and c = 1.21 -1.29 nm, α = β = 90#176;, γ = 120#176;晶體類型:合成晶體純度:>99.995%
詳細(xì)介紹
硫硒化鉬晶體 MoSSe(Molybdenum Sulfide Diselenide) 晶體尺寸:~6毫米 電學(xué)性能:半導(dǎo)體 晶體結(jié)構(gòu):六邊形 晶胞參數(shù):取決于合金成分:a = b = 0.31 -0.33 nm and c = 1.21 -1.29 nm, α = β = 90°, γ = 120° 晶體類型:合成 晶體純度:>99.995%
X-ray diffraction on a MoSSe single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10
Powder X-ray diffraction (XRD) of a single crystal MoSSe. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal MoSSe by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal MoSSe. Measurement was performed with a 785 nm Raman system at room temperature.