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CleanMill Broad Ion Beam System

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High-quality observation and characterization of materials often require an artifact-free surface, which can be difficult to achieve with traditional polishing techniques like grinding or mechanical p......

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CleanMill Broad Ion Beam System features

High-energy ion source

The ultra-high-energy ion gun features a maximum accelerating voltage of 16 kV to rapidly mill and polish sample surfaces.

Ultra-fine surface polishing

The CleanMill System can be configured with an optional low-energy io n gun for final polishing of sample surfaces.

Wide acceleration voltage

The system delivers ion energy ranging from 2 kV to 16 kV and features dedicated optics for ultra-low-voltage polishing from 100 V to 2 kV.

CleanConnect System compatibility

Safely transfer samples from the CleanMill System to the microscope chamber using the Thermo Scientific IGST (inert gas sample transfer) Workflow to observe materials in their native states.